Our Scanning Electron Microscope (SEM) equipped with Energy Dispersive X-Ray Analysis (EDX) not only allows the high magnification observation/image capture of surface anomalies, but also allows bulk elemental analysis on the specimen being viewed. The variable pressure SEM allows wet and non-conductive samples to be viewed in their original state. This, along with a wide range of stereoscopic microscopes (ideal for dissections) and optical microscopes, provides for superb microscopy facilities.
